How Does Silicon Carbide Testing Actually Work?

We're at the Tektronix booth at APEC 2025 with Cameron Lowe, taking a deep dive into their latest innovations in double pulse testing—specifically for silicon carbide (SiC) and gallium nitride (GaN) power devices. We explore: • Tektronix’s double pulse test solution and what makes it ideal for modern high-speed switching environments • A look at high-performance probes including isolated current shunt and differential probes for accurate VDS, IDS, and VGS capture • The 5 Series oscilloscope, featuring advanced real-time measurements, automation, and higher resolution • How engineers can now get repeatable, accurate switching loss data • Tektronix’s acquisition of EA Elektro-Automatik and what it means for high power density testing setups • The AFG31000 function generator and its role in simplifying gate drive pulse generation • Key advantages in common-mode noise rejection and real-time energy loss calculations Whether you’re deep into power electronics, SiC/GaN topologies, or advanced oscilloscope workflows, this demo showcases tools built to handle tomorrow’s challenges—today.